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Spectral analysis of the vegetative background in the NIR and SWIR spectral range

: Winkelmann, Max


Stein, K.U. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Target and Background Signatures : 23 - 24 September 2015, Toulouse, France
Bellingham, WA: SPIE, 2015 (Proceedings of SPIE 9653)
ISBN: 9781628418637
Paper 96530D, 10 S.
Conference "Target and Background Signatures" <2015, Toulouse>
Fraunhofer IOSB ()
vegetation; spectral reflectance; camouflage; NIR; SWIR

Reflectance spectra of vegetative background areas are measured and their variation is analyzed. It is shown that the variation of different samples is significantly larger than the accuracy of the measurement. Furthermore the difference of diverse measurement procedures is discussed.