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A sparse multistatic imaging system for terahertz volume inspection

: Baccouche, Bessem; Kahl, M.; Keil, A.; Bolivar, P.H.; Loeffler, T.; Jonuscheit, Joachim; Friederich, Fabian


Institute of Electrical and Electronics Engineers -IEEE-:
40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015. Vol.1 : Hong Kong, China, 23 - 28 August 2015
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4799-8273-8
ISBN: 978-1-4799-8272-1
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <40, 2015, Hong Kong>
Fraunhofer IPM ()
terahertz wave imaging

Frequency modulated terahertz imaging systems have shown a great potential for volume inspections in the industrial process and quality control. However, many system concepts lack the capability to encompass a large field of view with fast data acquisition speed, while providing significant depth information. Based on our recently outlined system design of a terahertz imaging solution for the industrial process control, we report on the realization of a stepped-frequency modulated sparse array with 12 emitters and 12 heterodyne receivers operating in the frequency range from 75 GHz to 110 GHz. The system is ready to perform imaging tasks and will be in a final step combined with a band-conveyor for fast terahertz image acquisition.