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Grazing incidence x-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
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2000
Journal Article
Titel
Grazing incidence x-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Author(s)
Buttard, D.
Eymery, J.
Rieutord, F.
Fournel, F.
Lübbert, D.
Baumbach, T.
Moriceau, H.
Zeitschrift
Physica. B
DOI
10.1016/S0921-4526(99)01900-6
Language
English
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