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Investigation of SiGe/Si - heterostructures with high resolution x-ray diffraction methods
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2000
Conference Paper
Titel
Investigation of SiGe/Si - heterostructures with high resolution x-ray diffraction methods
Author(s)
Frohberg, K.
Wehner, B.
Trui, B.
Wolf, K.
Paufler, P.
Kück, H.
Hauptwerk
Sixth European Powder Diffraction Conference 1998. Proceedings. Vol.1
Konferenz
European Powder Diffraction Conference (EPDIC) 1998
Language
English
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