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Aspects of barium contamination in high dielectric dynamic random-access memories
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2000
Journal Article
Titel
Aspects of barium contamination in high dielectric dynamic random-access memories
Author(s)
Boubekeur, H.
Hopfner, J.
Mikolajick, T.
Dehm, C.
Frey, L.
Ryssel, H.
Zeitschrift
Journal of the Electrochemical Society
DOI
10.1149/1.1394057
Language
English
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Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB