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A detailed study on TEM waveguides' field distribution and efficiency

: Hamann, David; Garbe, Heyno; Pusch, Thorsten; Suhrke, Michael


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electromagnetic Compatibility Society:
IEEE International Symposium on Electromagnetic Compatibility, EMC 2015. Vol.2 : Joint conference with EMC Europe; Dresden, Germany, 16 - 22 August 2015
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4799-6615-8 (Print)
ISBN: 978-1-4799-6617-2
ISBN: 978-1-4799-6616-5
International Symposium on Electromagnetic Compatibility (EMC) <2015, Dresden>
International Symposium on Electromagnetic Compatibility (EMC Europe) <2015, Dresden>
Fraunhofer INT ()
TEM waveguide; efficiency; field calibration; measurement uncertainty; uniform field area

This work discusses the results of extensive measurements of the electric field strength in the uniform field area of different transverse electromagnetic (TEM) waveguides, namely a gigahertz transverse electromagnetic cell and an open waveguide. Different methods of calculating the forward power required for normative immunity testing are compared. The field homogeneities' uncertainty contribution is analyzed and the effect of the position of the uniform field area in the cross section is discussed for different sizes of the uniform field area. Finally, the secondary field components are analyzed.