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A large-scale technology evaluation study: Effects of model-based analysis and testing

 
: Kläs, Michael; Bauer, Thomas; Dereani, Andreas; Soederqvist, Thomas; Helle, Philipp

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Institute of Electrical and Electronics Engineers -IEEE-; Association for Computing Machinery -ACM-; IEEE Computer Society, Technical Council on Software Engineering:
IEEE/ACM 37th IEEE International Conference on Software Engineering, ICSE 2015. Proceedings. Vol.2, Pt.1 : Florence, Italy, 16 - 24 May 2015; Held in conjunction with MOBILESoft 2015, MSR 2015, OSS 2015
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4799-1935-2
ISBN: 978-1-4799-1934-5
S.119-128
International Conference on Software Engineering (ICSE) <37, 2015, Florence>
Englisch
Konferenzbeitrag
Fraunhofer IESE ()
logic program testing; computer programs - verification; software cost estimation; software quality; automotive telematic system; avionics; model-based software development; software quality assurance; test coverage; testing; validation; verification; empirical study; GQM+Strategies; model-based testing; context; Data Modeling; software; software engineering; testing

Abstract
Besides model-based development, model-based quality assurance and the tighter integration of static and dynamic quality assurance activities are becoming increasingly relevant in the development of software-intensive systems. Thus, this paper reports on an empirical study aimed at investigating the promises regarding quality improvements and cost savings. The evaluation comprises data from 13 industry case studies conducted during a three-year large-scale research project in the transportation domain (automotive, avionics, rail system). During the evaluation, we identified major goals and strategies associated with (integrated) model-based analysis and testing and evaluated the improvements achieved. The aggregated results indicate an average cost reduction of between 29% and 34% for verification and validation and of between 22% and 32% for defect removal. Compared with these cost savings, improvements regarding test coverage (~8%), number of remaining defects (~13%), and time to market (~8%) appear less noticeable.

: http://publica.fraunhofer.de/dokumente/N-367123.html