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Pattern-based approach for designing fail-operational safety-critical embedded systems

: Penha, Dulcineia; Weiß, Gereon; Stante, Alexander

Postprint urn:nbn:de:0011-n-3670822 (538 KByte PDF)
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Erstellt am: 22.1.2016

Institute of Electrical and Electronics Engineers -IEEE-:
13th IEEE/IFIP International Conference on Embedded and Ubiquitous Computing, EUC 2015 : October 21-23, 2015, Porto, Portugal; Proceedings
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4673-8299-1
International Conference on Embedded and Ubiquitous Computing (EUC) <13, 2015, Porto>
European Commission EC
FP7; 608945; SafeAdapt
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ESK ()
embedded systems; networked embedded systems; reliability; adaptability; software architecture; architectural pattern; safety; fail operational; FO; safety-critical networked embedded systems; SCNES; automotive software

To deal with fail-operational (FO) requirements intoday’s safety-critical networked embedded systems (SCNES), engineers have to resort to concepts such as redundancy, monitoring, and special shutdown procedures. Hardware-based redundancy approaches are not applicable to many embedded systems domains (e.g., automotive systems), because of prohibitive costs. In this scenario, adaptability concepts can be used to fulfill these FO requirements while enabling optimized resource utilization. However, the applicability of such concepts highly depends on the support for the engineering during system development. We propose an approach to cope with the challenges of fail-operational behavior of SCNES in which engineers are supported by design concepts for realizing safety, reliability, and adaptability requirements through the use of architectural patterns. The approach allows expressing FO concepts at the software architecture level. This lowers the effort for developing SCNES by utilizing generic patterns for genera land reoccurring mechanisms.