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Test patterns with TTCN-3

 
: Vouffo-Feudjio, A.; Schieferdecker, I.

Grabowski, J.:
Formal approaches to software testing : 4th international workshop, FATES 2004, Linz, Austria, September 21, 2004 ; revised selected papers
Berlin: Springer, 2005 (Lecture Notes in Computer Science 3395)
ISBN: 3-540-25109-X
ISSN: 0302-9743
S.170-179
International Workshop on Formal Approaches to Testing of Software (FATES) <4, 2004, Linz>
Englisch
Konferenzbeitrag
Fraunhofer FOKUS ()

Abstract
Patterns are used in various engineering disciplines to represent common aspects of a set of solutions to a (set of) common problem(s). This paper discusses main concepts of test patterns, provides a characterization of test patterns and describes the use of test patterns in the test development process. Test patterns can be used to support the vertical reuse between different testing phases and testing kinds, horizontal reuse between different product version and historical reuse between different product versions. Specification means for test patterns will be analysed and compared with the language features of the Testing and Test Control Notation (TTCN-3)

: http://publica.fraunhofer.de/dokumente/N-36621.html