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Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer

: Taudt, Christopher; Baselt, Tobias; Oreski, Gernot; Hirschl, Christina; Koch, Edmund; Hartmann, Peter

Präsentation urn:nbn:de:0011-n-3601157 (2.1 MByte PDF)
MD5 Fingerprint: f80fdfa676bbe8a5fbb08f3802b92e2a
Erstellt am: 19.9.2015

Volltext urn:nbn:de:0011-n-360115-10 (566 KByte PDF)
MD5 Fingerprint: 1e98db7f63dc383665a6e458148ceb7e
Erstellt am: 6.11.2015

Lehmann, P. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Optical Measurement Systems for Industrial Inspection IX : 22-25 June 2015, Munich, Germany
Bellingham, WA: SPIE, 2015 (Proceedings of SPIE 9525)
ISBN: 978-1-62841-685-5
Paper 95250P, 6 S.
Conference "Optical Measurement Systems for Industrial Inspection" <9, 2015, Munich>
Bundesministerium für Verkehr, Innovation und Technologie BMVIT (Österreich)
e!mission; 838650; EVAnetz
Bundesministerium für Land- und Forstwirtschaft, Umwelt und Wasserwirtschaft BMLFUW (Österreich)
e!mission; 838650; EVAnetz
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IWS ()

This work analyses samples of the widely used encapsulant of photovoltaics modules, ethylene vinyl acetate (EVA). The samples were cross-linked using a lamination technique for different curing times (0 - 20 minutes). The cross-linking characterization is done by determinating the material dispersion with the aid of a combined temporal- and spectral domain white-light interferometer. With the proposed technique it was possible to discriminate the differences in crosslinking for the given curing times. One important feature of this approach is the possibility to perform space resolved measurements of the crosslinking state with μm-resolution. Furthermore the paper discusses the mathematical analysis and processing of measurement data and shows a prototype solution for the fast and automated data acquisition for industrial application.