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2005
Conference Paper
Titel
NIR spectroscopy for surface inspection
Abstract
With near infrared spectroscopy systems it is possible to quantify the thickness and determine the consistency of the surface layers. The detectable layers are in a range of some hundred nanometres. The fields of applications range from detection of contamination films after technical cleaning processes to measurement of coatings. A wide variety of testing applications can be covered with this non-visible imaging technology. The presentation will show the possibilities from research intensive applications in laboratories up to process integrated systems in manufacturing environments.
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