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Closing the gap between speed and configurability of multi-bit fault emulation environments for security and safety-critical designs

: Nyberg, R.; Nolles, J.; Heyszl, J.; Rabe, D.; Sigl, G.


Quaglia, D. ; Institute of Electrical and Electronics Engineers -IEEE-:
17th Euromicro Conference on Digital System Design, DSD 2014. Proceedings : Verona, Italy, 27 - 29 August 2014
Los Alamitos, Calif.: IEEE Computer Society Conference Publishing Services (CPS), 2014
ISBN: 978-1-4799-7135-0
ISBN: 978-1-4799-5793-4
Euromicro Conference on Digital System Design (DSD) <17, 2014, Verona>
Fraunhofer AISEC ()

Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount of multi-bit fault occurrences, e.g. during fault attacks against cryptographic implementations. Therefore, multi-bit fault injection becomes more important during security and safety verification. Fault injection techniques which are applicable during the development cycle of a device are based on either software implementations, e.g. formal methods and simulations, or fault emulation environments in hardware. So far, simulations provide the best configurability whereas fault emulation environments provide the best performance in terms of run time. This contribution presents an FPGA-based emulation environment that combines the advantages of both simulation-based and emulation-based environments. To the best of our knowledge, we are the first to achieve this. Permanent and transient multi-bit faults are configurable at run time where the selection of a fault model, the configuration of the injection time and fault duration is supported without the need for re-synthesizing the design. We propose three measures for performance optimization allowing us to support all the fault configuration capabilities at run time without performance penalty. Our experimental results show that the presented emulation environment reaches the theoretical optimal performance for a wide range of fault configurations using our proposed optimizations.