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Analyses of interfaces in wafer-bonded tandem solar cells by aberration-corrected STEM and EELS
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2014
Journal Article
Titel
Analyses of interfaces in wafer-bonded tandem solar cells by aberration-corrected STEM and EELS
Author(s)
Häussler, D.
Houben, L.
Dunin-Borkowski, Rafal E.
Essig, Stephanie
Dimroth, Frank
Jäger, W.
Zeitschrift
Microscopy and microanalysis
DOI
10.1017/S1431927614004000
Language
English
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Fraunhofer-Institut für Solare Energiesysteme ISE