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Reliability characterization of blind-hole vias for a system-in-foil

 
: Lorenz, E.; Niemann, N.; Koyuncu, M.; Bock, K.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Components, Packaging, and Manufacturing Technology Society:
ESTC 2014, Electronics System Integration Technology Conference : Helsinki, Finland; 16.09. - 18.09.2014
Piscataway, NJ: IEEE, 2014
ISBN: 978-1-4799-4026-4
ISBN: 978-1-4799-4027-1
ISBN: 978-1-4799-4025-7
S.473-478
Electronics System Integration Technology Conference (ESTC) <5, 2014, Helsinki>
Englisch
Konferenzbeitrag
Fraunhofer EMFT ()

Abstract
In this study the bending reliability of an isotropic conductive adhesive (ICA) filled between two printed circuit foils (PCF) as interconnection for a System-in-Foil is evaluated. The filling is realized by a Jet-Dispense process on oxygen plasma treated, as well as non-plasma treated foils. The samples are tested on a bending test setup capable of real-time electrical measurements during bending. A significant improvement of the bending stability is achieved with the plasma treatment process, while the main failure mechanism for the non-plasma treated samples is delamination at the pad-adhesive interface.

: http://publica.fraunhofer.de/dokumente/N-351406.html