Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

An approach to generate test signals for analog circuits – a control-theoretic perspective

 
: Vermeiren, Wolfgang; Hopsch, Fabian; Jancke, Roland

:
Postprint urn:nbn:de:0011-n-3499483 (415 KByte PDF)
MD5 Fingerprint: 522289de1fc30da6deb37db61a804468
© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Erstellt am: 5.8.2015


IEEE Computer Society, Test Technology Technical Council -TTTC-; Institute of Electrical and Electronics Engineers -IEEE-:
20th International Mixed-Signal Testing Workshop, IMSTW 2015 : 24 - 26 June 2015, Paris, France
Amissville, Va.: IEEE Computer Society, TTTC, 2015
ISBN: 978-1-4673-6732-5 (ISBN)
6 S.
International Mixed-Signal Testing Workshop (IMSTW) <20, 2015, Paris>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

Abstract
This paper presents a control-theoretic driven approach to the automatic generation of test signals for analog circuits or systems. It is based on the adaption of a tracking control structure for the task of generating test signals aimed at manufacturing test for a finished circuit design. The approach will be derived and its functionality is demonstrated using circuit examples. The integration of the proposed approach within a more general test development procedure for improving the fault coverage is explained.

: http://publica.fraunhofer.de/dokumente/N-349948.html