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An approach to generate test signals for analog circuits – a control-theoretic perspective

: Vermeiren, Wolfgang; Hopsch, Fabian; Jancke, Roland

Postprint urn:nbn:de:0011-n-3499483 (415 KByte PDF)
MD5 Fingerprint: 522289de1fc30da6deb37db61a804468
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Erstellt am: 5.8.2015

IEEE Computer Society, Test Technology Technical Council -TTTC-; Institute of Electrical and Electronics Engineers -IEEE-:
20th International Mixed-Signal Testing Workshop, IMSTW 2015 : 24 - 26 June 2015, Paris, France
Amissville, Va.: IEEE Computer Society, TTTC, 2015
ISBN: 978-1-4673-6732-5 (ISBN)
6 S.
International Mixed-Signal Testing Workshop (IMSTW) <20, 2015, Paris>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

This paper presents a control-theoretic driven approach to the automatic generation of test signals for analog circuits or systems. It is based on the adaption of a tracking control structure for the task of generating test signals aimed at manufacturing test for a finished circuit design. The approach will be derived and its functionality is demonstrated using circuit examples. The integration of the proposed approach within a more general test development procedure for improving the fault coverage is explained.