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Apertureless SNOM imaging of the surface phonon polariton waves. What do we measure?

: Kazantsev, D.V.; Ryssel, H.


Applied physics. A 113 (2013), Nr.1, S.27-30
ISSN: 0340-3793
ISSN: 0721-7250
ISSN: 0947-8396 (Print)
ISSN: 1432-0630 (Online)
Fraunhofer IISB ()

The apertureless scanning near-field microscope (ASNOM) mapping of surface phonon polariton (SPP) waves being excited at the surface of the SiC polar crystal at a frequency corresponding to the lattice resonance was investigated. The wave with well-defined direction and source position, as well as a well-known propagation law, was used to calibrate the signal of an ASNOM. An experimental proof is presented showing that the signal collected by the ASNOM in such a case is proportional (as a complex number) to the local field amplitude above the surface, regardless of the tip response model.
It is shown that the expression describing an ASNOM response, which is, in general case, rather complicated nonlinear function of a surface/tip dielectric constants, wavelength, tip vibration amplitude, tip shape etc., can be dramatically simplified in the case of the SPP waves mapping in a mid-IR range, due to a lucky combination of the tip and surface parameters for the case being considered. A tip vibration amplitude is much less than a running SPP wave field decay height in a normal direction. At the same time, the tip amplitude is larger than a characteristic distance at which a tip–surface electromagnetic near-field interaction plays a significant role.