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An industrial case study of implementing and validating defect classification for process improvement and quality management

 
: Freimut, B.; Denger, C.; Ketterer, M.

:

IEEE Computer Society:
11th International Software Metrics Symposium, Metrics 2005. Proceedings
Piscataway: IEEE Computer Society, 2005
ISBN: 0-7695-2371-4
10 S. : Ill., Lit.
International Software Metrics Symposium <11, 2005, Como>
Englisch
Konferenzbeitrag
Fraunhofer IESE ()
defect classification; case study; process improvement; quality

Abstract
Defect measurement plays a crucial role when assessing quality assurance processes such as inspections and testing. To systematically combine these processes in the context of an integrated quality assurance strategy, measurement must provide empirical evidence on how effective these processes are and which types of defects are detected by which quality assurance process. Typically, defect classification schemes, such as ODC or the Hewlett-Packard scheme, are used to measure defects for this purpose. However, we found it difficult to transfer existing schemes to an embedded software context, where specific document- and defect types have to be considered. This paper presents an approach to define, introduce, and validate a customized defect classification scheme that considers the specifics of an industrial environment. The core of the approach is to combine the software engineering know-how of measurement experts and the domain know-how of developers. In addition to the approach, we present the results and experiences of using the approach in an industrial setting. The results indicate that our approach results in a defect classification scheme that allows classifying defects with good reliability, that allows identifying process improvement actions, and that can serve as a baseline for evaluating the impact of process improvements.

: http://publica.fraunhofer.de/dokumente/N-34034.html