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Angular response of grating-coupled quantum well infrared photodetectors: An experimental study

Winkelabhängige Response von gittergekoppelten Quantumwell Infrarot-Photodetektoren: Eine experimentelle Studie
 
: Rouzo, J. le; Ribet-Mohamed, I.; Guerineau, N.; Tauvy, M.; Schneider, H.; Maier, T.

:

Andresen, B.F. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Infrared Technology and Applications XXXI. Vol.2 : 28 March - 1 April 2005, Orlando, Florida, USA; Infrared Technology Applications Conference held as part of SPIE'S International Defense and Security Symposium, DSS
Bellingham/Wash.: SPIE, 2005 (SPIE Proceedings Series 5783)
ISBN: 0-8194-5768-X
S.747-754
Infrared Technology and Applications Conference <31, 2004, Orlando/Fla.>
International Defense and Security Symposium (DSS) <2005, Orlando/Fla.>
Englisch
Konferenzbeitrag
Fraunhofer IAF ()
GaAs/AlGaAs; Qwip; grating; Gitter; diffraction; Beugung

Abstract
QWIPs are nowadays considered as rather good candidates for multispectral imaging. Indeed, their narrow spectral bandwidth can be tailored by band gap engineering, and they rely on the use of the mature GaAs technology. However, a light coupling scheme, such as 2D-grating for example, is required to obtain normal incidence absorption. The geometrical parameters of this 2D-grating (grating period, etch depth of the grating) need to be optimized. This optimization is particularly difficult for dual-band pixels, since a compromise is required between the two wavelengths. This paper deals with the influence of the etch depth of the grating on the angular response of quantum well infrared photodetectors. We will first present the experimental setup which was specifically developed at ONERA to perform angular response measurements on infrared photodetectors from different technologies. The results obtained on "low-noise" QWIP samples provided by Fraunhofer-IAF will be presented and analyzed, with emphasis on the effect of the etch depth of the grating on the angular response.

: http://publica.fraunhofer.de/dokumente/N-33996.html