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Nano- and micrometer scale surface topography modification of Si (100) by Ga focused ion beam irradiation

Poster presented at BRAMAT 2015, 9th International Conference on Materials Science & Engineering, Brasov, Romania, 5-7 March 2015
 
: Rai, Deepa

:
Poster urn:nbn:de:0011-n-3331161 (1.2 MByte PDF)
MD5 Fingerprint: 7efa1197264efbe4d78c07c28cdfaad1
Erstellt am: 9.4.2015


2015, 1 Folie
International Conference on Materials Science & Engineering (BRAMAT) <9, 2015, Brasov/Romania>
European Commission EC
FP7-ITN; 316560; STEEP
A Synergetic Training network on Energy Beam Processing: From modelling to industrial applications
Englisch
Poster, Elektronische Publikation
Fraunhofer IISB ()
focused ion beam (FIB); ripple formation

: http://publica.fraunhofer.de/dokumente/N-333116.html