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Advances in micro-nano reliability research for smart systems integration using crack avoidance strategies
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2014
Book Article
Titel
Advances in micro-nano reliability research for smart systems integration using crack avoidance strategies
Author(s)
Michel, Bernd
Winkler, T.
Shirangi, H.
Wondrak, W.
Pufall, R.
Hauptwerk
Smart systems integration for micro- and nanotechnologies
Language
English
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Fraunhofer-Institut für Elektronische Nanosysteme ENAS