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CMOS-TDI detector technology for reconnaissance application

: Eckardt, Andreas; Reulke, Ralf; Jung, Melanie; Sengebusch, Karsten


Huckridge, D.A. (Ed.) ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Electro-Optical and Infrared Systems: Technology and Applications XI : 22 - 25 September 2014, Amsterdam, Netherlands
Bellingham, WA: SPIE, 2014 (Proceedings of SPIE 9249)
ISBN: 978-1-62841-312-0
Paper 92490V, 9 S.
Conference "Electro-Optical and Infrared Systems - Technology and Applications" <11, 2014, Amsterdam>
Fraunhofer IMS ()
CMOS-TDI; VNIR; very thin CMOS TDI detector; MTF; new detector architecture

The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 30 years of experience with high-resolution imaging technology. This paper shows the institute's scientific results of the leading-edge detector design CMOS in a TDI (Time Delay and Integration) architecture. This project includes the technological design of future high or multi-spectral resolution spaceborne instruments and the possibility of higher integration. DLR OS and the Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) in Duisburg were driving the technology of new detectors and the FPA design for future projects, new manufacturing accuracy and on-chip processing capability in order to keep pace with the ambitious scientific and user requirements. In combination with the engineering research, the current generation of space borne sensor systems is focusing on VIS/NIR high spectral resolution to meet the requirements on earth and planetary observation systems. The combination of large-swath and high-spectral resolution with intelligent synchronization control, fast-readout ADC (analog digital converter) chains and new focal-plane concepts opens the door to new remote-sensing and smart deep-space instruments. The paper gives an overview of the detector development status and verification program at DLR, as well as of new control possibilities for CMOS-TDI detectors in synchronization control mode.