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Differential Scan-Path: A Novel Solution for Secure Design-for-Testability

: Manich, Salvador; Wamser, Markus; Guillen, Oscar; Sigl, Georg


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Computer Society:
IEEE International Test Conference, ITC 2013. Proceedings : Anaheim, California, USA, 6 - 13 September 2013
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4799-0859-2
ISBN: 978-1-4799-0860-8
International Test Conference (ITC) <2013, Anaheim/Calif.>
Fraunhofer AISEC ()

In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponentially with scan path length while the resulting fault coverage is only marginally altered. Subtraction does not preserve parity, thus avoiding attacks using parity information. The structure is simple, needs little area and does not require unlocking keys. Through implementing the DiSP in an elliptic curve crypto-graphic coprocessor, we demonstrate how easily it can be integrated into existing design tools. Simulations show that test effectiveness is preserved and that the internal state is effectively hidden.