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Challenges in 3D die stacking

 
: Grafe, Jürgen; Wahrmund, W.; Dobritz, S.; Wolf, M.J.; Lang, K.-D.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 64th Electronic Components and Technology Conference, ECTC 2014 : 27-30 May 2014, Orlando, Florida, USA
Piscataway, NJ: IEEE, 2014
ISBN: 978-1-4799-2406-6
ISBN: 978-1-4799-2407-3
ISBN: 978-1-4799-2408-0
ISBN: 978-1-4799-2407-3
S.873-877
Electronic Components and Technology Conference (ECTC) <64, 2014, Orlando/Fla.>
Englisch
Konferenzbeitrag
Fraunhofer IZM ()

Abstract
Many semiconductor companies are currently engaged in 3D system integration. The assembly of 3D compliant chips becomes a vital factor of the 3D application success and reliability. Major challenges are provided by very low chip thickness, large die size, small interconnect diameter and pitch. Diverse 3D assembly technologies and methods are currently under investigations which address these specific technical challenges. Stable and volume capable assembly processes must be developed in order to manufacture such products in future with reasonable cost. Wafer-to-wafer (W2W) assembly is not yet recommended for most of the advanced 3D applications since it still suffering from too high yield losses what would translate into unacceptable W2W stack yield. For that reason the die-to-die (D2D) assembly is considered as the more efficient way for the time being. For that reason we?re developing integrated assembly and test concepts on 300 mm wafer size to evaluate and validate various assembly technologies regarding to their capabilities with respect to interconnect materials, dimension, pitch and I/O density.

: http://publica.fraunhofer.de/dokumente/N-303664.html