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Radar measurements with micrometer accuracy and nanometer stability using an ultra-wideband 80 GHz radar system

: Pohl, N.


Institute of Electrical and Electronics Engineers -IEEE-:
IEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2013 : Austin, Texas, USA, 23 January 2013; Held as a part of the 2013 IEEE Radio and Wireless Week (RWW)], 20 - 23 January 2013
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4673-3104-3
ISBN: 978-1-4673-2931-6
ISBN: 978-1-4673-2930-9
Topical Conference on Wireless Sensors and Sensor Networks (WiSNet) <2013, Austin/Tex.>
Radio and Wireless Week (RWW) <7, 2013, Austin/Tex.>
Fraunhofer FHR

In this paper, a high precision 80 GHz radar distance measurement system is presented. It is based on an ultra-wideband SiGe monostatic transceiver chip, which enables a bandwidth of 25.6 GHz around a center frequency of 80 GHz (i.e. 32%). All components besides the silicon radar chip are off-the-shelf electronics, which makes the sensor well-suited for low-cost industrial measurement applications. First, the measurement stability of the system is characterized. An excellent phase noise of -88 dBc/Hz (10 kHz offset from an 80 GHz carrier) was measured. Furthermore the stability of distance measurements inside a waveguide, are presented, which results in a standard deviation of the targets' phase of 0.008 degree, which corresponds to a distance jitter of 41 nm. Finally a measurement setup with a high precision linear motor on a low vibration table is used for distance measurements. A distance error below 4 micrometer was achieved and confirmed by three different measurement runs.