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Patterns in spatial analysis - detection framework and examples

 
: Scheider, S.; Voss, A.; Perrefort, S.

Goodchild, M.:
GIS Planet 2005. Conference proceedings. CD-ROM : May 30-June 2, Estoril, Portugal
Lisboa: Instituto Geografico Portugues, 2005
ISBN: 972-97367-5-8
16 S.
International Conference & Exhibition on Geographical Information (GISPLANET) <2005, Estoril>
Englisch
Konferenzbeitrag
Fraunhofer AIS ( IAIS) ()
spatial analysis and modeling; best practice; pattern language; efficient GIS solution

Abstract
His paper proposes a detection framework for patterns in spatial analysis, a way to find reusable stable solutions for persistent spatial analysis problems in application domains. Furthermore it tries to test this detection framework by 3 practical solution cases taken mostly from a business geographics context. With the help of an abstract language for describing spatial/multidimensional analysis tasks, generalized comparable descriptions can be derived from the set of practical solution examples. The detection of analysis patterns is a process of iterative refinement of pattern proposals by trying to find a common set of subtasks in a stepwise extended set of generalized solution descriptions. From the set of solution examples, 2 first pattern proposals could be derived: "spatial object interaction model finder", a pattern to find spatial extrapolation models for domains with contingent geographical object relations, and "retail market potential modeller", an implicit modeller of retail market potential for certain company types.

: http://publica.fraunhofer.de/dokumente/N-29282.html