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Internet–based testability driven test generation in virtual environment MOSCITO

: Schneider, A.; Diener, K.-H.; Elst, G.; Ivask, E.; Raik, J.; Ubar, R.

Volltext urn:nbn:de:0011-n-2874337 (205 KByte PDF)
MD5 Fingerprint: 1dcc985876c49310182c2e204aac3978
Erstellt am: 9.5.2014

Präsentation urn:nbn:de:0011-n-287433-13 (3.2 MByte PDF)
MD5 Fingerprint: 01397932b082a380834139ec4e2963b5
Erstellt am: 9.5.2014

International Federation for Information Processing -IFIP-:
International Workshop on IP-Based SoC Design 2002. Proceedings : Grenoble, October 30-31, 2002
Grenoble: World Trade Center, 2002
International Workshop on IP-Based SoC Design <2002, Grenoble>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

The paper describes an environment for an Internetbased co-operation in the field of design and test of digital systems. A VLSI design flow is combined with an Internet-based hierarchical automated test pattern generation (ATPG). A novel hierarchical ATPG driven by testability measures is presented. Both, the register-transfer (RT) and the gate level descriptions are used, and decision diagrams are exploited as a uniform model for describing systems at both levels, for calculating testability measures and for test generation. The ATPG and testability analyzer can be run at geographically different places under the virtual environment MOSCITO. The interfaces between the integrated tools and also the commercial design tools were developed and implemented. The functionality of the integrated design and test system was verified in several co-operative experiments over Internet by partners in different geographical sites. The experimental results have shown the advantages of using structural tests generated by ATPG compared to using functional test sequences created by designers.