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High-speed deformation measurement using spatially phase-shifted speckle interferometry

 
: Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel

:
Volltext urn:nbn:de:0011-n-2832140 (2.8 MByte PDF)
MD5 Fingerprint: 5bed71195448333e846cb54e33c7ab00
Copyright Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Erstellt am: 4.2.2016


Bjelkhagen, H.I. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Practical Holography XXVIII. Materials and Applications : February 2014, San Francisco, CA, USA
Bellingham, WA: SPIE, 2014 (Proceedings of SPIE 9006)
ISBN: 978-0-8194-9919-6
Paper 90060E
Conference "Practical Holography - Materials and Applications" <28, 2014, San Francisco/Calif.>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IPM ()
speckle interferometry; deformation; real-time

Abstract
Electronic speckle pattern interferometry (ESPI)is a powerful technique for differential shape measurement with submicron resolution. Using spatial phase-shifting (SPS), no moving parts are required, allowing frame acquisition rates limited by camera hardware. We present ESPI images of 1 megapixel resolution at 500 fps. Analysis of SPS data involves complex, time-consuming calculations. The graphics processing units found in state-of-the-art personal computers have exceptional parallel processing capabilities, allowing real-time SPS measurements at video frame rates. Deformation analysis at this frame rate can be used to analyze transient phenomena such as transient temperature effects in integrated circuit chips or during material processing.

: http://publica.fraunhofer.de/dokumente/N-283214.html