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Reliable synchronization accuracy in IEEE 1588 networks using device qualification with standard test patterns

 
: Flatt, Holger; Schriegel, Sebastian; Jasperneite, Jürgen

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Instrumentation and Measurement Society:
ISPCS 2013, International IEEE Symposium on Precision Clock Synchronization for Measurement, Control and Communication. Proceedings : 22-27 September 2013, Lemgo, Germany
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4799-0241-5 (Print)
ISBN: 978-1-4799-0242-2
ISBN: 978-1-4799-0240-8
S.107-112
International Symposium on Precision Clock Synchronization for Measurement, Control and Communication (ISPCS) <2013, Lemgo>
Englisch
Konferenzbeitrag
Fraunhofer IOSB ()

Abstract
This paper presents a device qualification approach for IEEE 1588 devices. Based on repetitive measurements within heterogeneous networks, standard stimulation data and device reaction values are defined for qualification of PTP bridges. According to these measurements, PTP bridges are classified into three classes basic, advanced, and high-performance. In order to execute the required device tests, a special IEEE 1588 Test Adapter is proposed, which operates as a hardware-in-the-loop tester. This Test Adapter, which is mapped onto a cost-efficient Altera Cyclone IV FPGA, is controlled by a standard PC and implements all time-critical PTP tasks in hardware. Within a case study, this Test Adapter is validated for analyzing and performance qualification of five exemplary PTP bridges. Overall, the proposed qualification approach in combination with the IEEE 1588 Test Adapter supports vendors and operators of PTP bridges to quantify the synchronization accuracy of a PTP bridge within a complex IEEE 1588 network without utilizing complex simulation models.

: http://publica.fraunhofer.de/dokumente/N-275744.html