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Modeling the leakage current for potential induced degradation

: Hoffmann, S.


Mine, A. ; European Commission:
28th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2013. Proceedings. DVD-ROM : 30 September to 04 October 2013, Paris, France
München: WIP-Renewable Energies, 2013
ISBN: 3-936338-33-7
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <28, 2013, Paris>
Fraunhofer ISE ()
Photovoltaische Module; Systeme und Zuverlässigkeit; Photovoltaische Module und Kraftwerke; Photovoltaische Module - Systeme und Zuverlässigkeit; Gebrauchsdauer von Modulen und Materialien; Gebrauchsdaueranalyse und Umweltsimulation; PID; reliability

The climatic conditions play an important role for a degradation mechanism of photovoltaic modules, known as potential induced degradation (PID). The influence of ambient humidity, precipitation and temperature on the leakage current has been investigated with high voltage stress in two different climate regions. This work focusses on one of them (Freiburg, Germany) It was found out, that for this test site, rain seems to be a serious problem as a conductive layer is established that leads to a high leakage current. A temperature dependency such as found in indoor test was found as well.