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Appearance measurement by wave-scan DOI and profilometry

Lackstrukturmessung mit wave-scan DOI und Tastschnittverfahren
 
: Schneider, M.

BYK-Gardner GmbH:
6th wave-scan User Meeting 2004 : 20th / 21st April 2004, Königsdorf, Germany
Geretsried, 2004
wave-scan User Meeting <6, 2004, Königsdorf>
Englisch
Konferenzbeitrag
Fraunhofer IPA ()
Lackfilm; Lackfilmstruktur; distinctness of image (DOI); Tastschnittverfahren; Lack; Optisches Meßverfahren

Abstract
Comparative measurements using the optical device wave-scan DOI and profilometry have been carried out on a clear coat wedge. A correlation between both measuring techniques could be found over a wide range of paint film structures. Matt surfaces can be measured only by profilometry. However, using the correlation between both methods, a complementary use of wave-scan DOI and profilometry is possible for the characterization of multi-layer coatings.

: http://publica.fraunhofer.de/dokumente/N-26533.html