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2004
Conference Paper
Titel
Appearance measurement by wave-scan DOI and profilometry
Alternative
Lackstrukturmessung mit wave-scan DOI und Tastschnittverfahren
Abstract
Comparative measurements using the optical device wave-scan DOI and profilometry have been carried out on a clear coat wedge. A correlation between both measuring techniques could be found over a wide range of paint film structures. Matt surfaces can be measured only by profilometry. However, using the correlation between both methods, a complementary use of wave-scan DOI and profilometry is possible for the characterization of multi-layer coatings.
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