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Evaluation of X-ray imaging properties of structured aluminum oxide matrices filled with different scintillator materials

 
: Muhlbauer, J.; Semmelroth, K.; Kruger, P.; Schreiber, J.; Mukhurov, N.I.; Uhlmann, N.

:

Yu, B. ; IEEE Nuclear and Plasma Sciences Society:
IEEE Nuclear Science Symposium and Medical Imaging, NSS/MIC 2012. Conference record. Vol.1 : Anaheim, California, USA, 27 October - 3 November 2012 and the 19th Room-Temperature Semiconductor X-Ray and Gamma-Ray Detector Workshop
Piscataway, NJ: IEEE Service Center, 2012
ISBN: 978-1-4673-2028-3 (print)
ISBN: 978-1-4673-2030-6 (online)
S.399-401
Nuclear Science Symposium (NSS) <2012, Anaheim/Calif.>
Medical Imaging Conference (MIC) <2012, Anaheim/Calif.>
Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD) <19, 2012, Anaheim/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer IISB ()

Abstract
The spatial resolution of currently commercially available X-ray scintillators is limited by their thickness. For instance a scintillator with a high thickness, yields a high efficiency but suffers from a decrease in spatial resolution due to (optical) light spreading in the scintillation layer. For thinner scintillators the opposing case is observed. The filling of structures like self-organized aluminum oxide (Alox), permits the fabrication of very thick and therefore highly efficient scintillator matrices without losing spatial resolution, due to the matrix' channel-like structures which act as light guides. We filled such structured Alox-matrices with different scintillator materials with two different methods. Non-hygroscopic scintillators like GOS or LSO can by filled into the matrices by a sedimentation process, but hygroscopic materials like CsI:Tl require a 'dry' process like melting. The focus of this paper is on the evaluation of the X-ray imaging properties of these filled matrices with respect to the achievable spatial resolution and signal-to-noise ratio. Especially for the CsI:Tl filled matrix we also studied the optical emission spectra, due to a loss of the dopant thallium during the melting process.

: http://publica.fraunhofer.de/dokumente/N-263957.html