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Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

: Syha, M.; Trenkle, A.; Lödermann, B.; Graff, A.; Ludwig, W.; Weygand, D.; Gumbsch, P.


Journal of Applied Crystallography 46 (2013), S.1145-1150
ISSN: 0021-8898
Deutsche Forschungsgemeinschaft DFG
Fraunhofer IWM ( IMWS) ()
microstructure characterization; diffraction contrast tomography; electron backscatter diffraction

Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.