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Figures of uncertainty for noise measurements

 
: Seelmann-Eggebert, M.; Baldischweiler, B.; Aja, B.; Bruch, D.; Massler, H.

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Institute of Electrical and Electronics Engineers -IEEE-:
81st ARFTG Microwave Measrurement Conference 2013 : Metrology for High Speed Circuits and Systems, June 7th, 2013, Seattle, Washington
Piscataway/NJ: IEEE, 2013
ISBN: 978-1-4673-4981-9 (Print)
ISBN: 978-1-4673-4982-6
ISBN: 978-1-4673-4983-3
4 S.
Microwave Measurement Conference <81, 2013, Seattle/Wash.>
Englisch
Konferenzbeitrag
Fraunhofer IAF ()
noise figure; noise parameters; low-noise transistor; microwave noise measurements; error analysis; uncertainty; deembedding

Abstract
In this paper we introduce two figures of uncertainty (FOU) for the assessment of noise figure measurements. These figures of uncertainty are readily determined if the scattering parameters of the device under test (DUT) are available. The two FOUs provide two types of information. On one hand side, they allow for a simple consistency check of the two measurements. On the other side, they give a measure for the accuracy and reliability of the noise figure, which in many cases may be limited due to second stage corrections. We suggest to include the two FOUs routinely as supplements for noise figure measurements.

: http://publica.fraunhofer.de/dokumente/N-259419.html