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EUFANET workshop 2012 report

 
: Touzel, J.

Electronic device failure analysis : EDFAS 15 (2013), Nr.3, S.20-23
ISSN: 1537-0755
Englisch
Zeitschriftenaufsatz
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
The third extended European Failure Analysis Network (EUFANET) workshop, entitled 'Smart FA for New Materials in Electronic Devices' was held at the Fraunhofer Center for Nanoelectronic Technology in Dresden, Germany from September 17-18, 2012. The workshop was an open network dedicated to failure analysis of electronic components, systems and their assembly. The goal of the network was to boost the exchange of technical information within the European FA community and to keep the participating FA labs in contact. The latest workshop had seven sessions scheduled over two days that dealt with the conventional silicon-based FA world along with the emerging field of organic electronics. The opening session gave an overview of the prevailing trends in technology and materials for advanced technology nodes manufactured by Globalfoundries or Infineon and described the latest advancements in large-area organic electronics.

: http://publica.fraunhofer.de/dokumente/N-254610.html