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In-situ aberration measurement technique based on aerial image with optimized source

 
: Yan, G.; Wang, X.; Li, S.; Yang, J.; Xu, D.; Duan, L.; Bourov, A.Y.; Erdmann, A.

:

Smith, D.G. (Ed.) ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Optical Systems Design 2012 : 26.-29.11.2012, Barcelona, Spain
Bellingham, WA: SPIE, 2012 (Proceedings of SPIE 8550)
ISBN: 978-0-8194-9301-9
Art. 85503N
Conference "Optical Systems Design" <2012, Barcelona>
Englisch
Konferenzbeitrag
Fraunhofer IISB ()

Abstract
An in-situ aberration measurement technique based on aerial image with optimized source is proposed. A linear relationship between aerial image and Zernike coefficients is established by principle component analysis and regression analysis. The linear relationship is used to extract aberrations. The impacts of the source on regression matrix character and the Zernike aberrations measurement accuracy are analyzed. An evaluation function for the aberrations measurement accuracy is introduced to optimize the source. Parameters of the source are optimized by the evaluation function using the simulators Dr.LiTHO and PROLITH. Then the optimized source parameters are adopted in our method. Compared with the previous aberration measurement technique based on principal component analysis of aerial image (AMAI-PCA), the number terms of Zernike coefficients that can be measured are increased from 7 to 27, and the Zernike aberrations measurement accuracy is improved by more than 20%.

: http://publica.fraunhofer.de/dokumente/N-254235.html