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Thermoelectric property characterisations and structural analysis of nanoalloyed SbxTe1-x multilayer thin films

: Liu, X.; Winkler, M.; König, J.D.; Schürmann, U.; Bensch, W.; Böttner, H.; Kienle, L.


Paraskevopoulos, K.M.:
9th European Conference on Thermoelectrics, ECT 2011 : 28-30 September 2011, Thessaloniki, Greece
Woodbury, N.Y.: AIP, 2012 (AIP Conference Proceedings 1449)
ISBN: 978-0-7354-1048-0
ISBN: 0-7354-1048-8
ISSN: 0094-243X
European Conference on Thermoelectrics (ECT) <9, 2011, Thessaloniki>
Fraunhofer IPM ()

Samples in the antimony rich region of binary system SbxTe 1-x were prepared as thin films using a molecular beam epitaxy (MBE) system. Layer thickness of the elements was varied for different samples within the range 10 to 33 Å to yield different compositions. Energy dispersive X-ray (EDX) spectroscopy was employed to determine the composition of the samples, of which the content of Te ranged from 40 at.% to 51 at.%. For all samples studied, the electrical conductivity, charge carrier mobility and concentration and Seebeck coefficient were measured at room temperature. A power factor (PF) of 20 W cm-1K2 was observed at room temperature for the annealed film with Te content of 41.8 at.%. Crystalline phase formation and transitions were observed by in-situ X-ray diffraction on the as-deposited samples. Rietveld analysis of the XRD data combined with high resolution transmission electron microscopy (HRTEM) images on the annealed samples exhibit an intrinsically disordered polycrystalline structure due to the deviation in compositions from stoichiometric Sb2Te3. In the current studies, the physical properties and their correlation with micro-structure are also discussed.