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Characterization of synthetic emeralds based on the morphology of their inclusions

: Mueller, A.; Hassler, U.; Zaeh, J.


Büyüköztürk, O.:
Nondestructive Testing of Materials and Structures : Proceedings of NDTMS-2011, Istanbul, Turkey, Mai 15-18, 2011
New York: Springer, 2012 (RILEM Bookseries 6)
ISBN: 978-94-007-0723-8
ISBN: 978-94-007-0722-1
International Symposium on Nondestructive Testing of Materials and Structures (NDTMS) <2011, Istanbul>
Fraunhofer IIS ()

The aim of the presented work was the characterization of synthetically manufactured emeralds by means of X-ray micro computed tomography (CT). As the result of the CT measurements, a three-dimensional volume representation of the gemstones became available. Three synthetic emeralds were measured containing different kinds of inclusions. For data evaluation, an image processing chain was designed, which is adapted to the particular requirements of emerald analysis. An essential aspect was the extraction of inclusions and inhomogeneities from the reconstructed volumetric data and their characterization regarding morphology. Furthermore, results of microscopic investigation of the samples have been compared to results of CT measurements demonstrating the suitability of CT for fi nding inclusions in emeralds.