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2012
Conference Paper
Titel
Characterization of synthetic emeralds based on the morphology of their inclusions
Abstract
The aim of the presented work was the characterization of synthetically manufactured emeralds by means of X-ray micro computed tomography (CT). As the result of the CT measurements, a three-dimensional volume representation of the gemstones became available. Three synthetic emeralds were measured containing different kinds of inclusions. For data evaluation, an image processing chain was designed, which is adapted to the particular requirements of emerald analysis. An essential aspect was the extraction of inclusions and inhomogeneities from the reconstructed volumetric data and their characterization regarding morphology. Furthermore, results of microscopic investigation of the samples have been compared to results of CT measurements demonstrating the suitability of CT for fi nding inclusions in emeralds.