Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Atomic force acoustic microscopy

: Rabe, Ute


Marinello, F. (Ed.):
Acoustic scanning probe microscopy
Berlin: Springer, 2013 (NanoScience and technology)
ISBN: 978-3-642-27493-0
ISBN: 978-3-642-27494-7
ISBN: 3-642-27493-5
Aufsatz in Buch
Fraunhofer IZFP ()
atomic force acoustic microscopy (AFAM)

This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), the basic theoretical models, the experimental techniques to obtain quantitative values of local elastic constants, and non-linear AFAM. Analytical and finite element models describing transverse flexural vibrations of AFM cantilevers with and without tip-surface contact are recapitulated. The models are suitable for micro fabricated silicon cantilevers of approximately rectangular cross section which are typically used in AFAM. Experimental methods to obtain single-point as well as array measurements and full spectroscopy images are discussed in combination with the respective reference methods for calibration. In a non-linear AFAM experiment, the vibration amplitudes of the sample surface and the cantilever are measured quantitatively with an interferometer at different excitation amplitudes, and the full tip-sample interaction force curve is reconstructed using a frequency dependent transfer function.