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Filter-based interrogation unit for optical wavelength shift sensors

: Wuchrer, R.; Härtling, T.


Peters, K.J. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013 : San Diego, California, USA, March 10-14, 2013
Bellingham, WA: SPIE, 2013 (Proceedings of SPIE 8693)
ISBN: 978-0-8194-9476-4
Paper 869304
Conference "Smart Sensor Phenomena, Technology, Networks, and Systems Integration" <2013, San Diego/Calif.>
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

We present a filter-based spectrometer consisting of a dielectric thin film filter with a lateral-spectral transmission gradient (linear variable filter) and a position detector which allows high resolution in wavelength shift registration. The resolving capacity of two interrogation unit variants (with segmented and homogeneous position detector, respectively) is examined using a monochromatic tunable light source. On the basis of the obtained results, we discuss several advantages and drawbacks of this interrogation approach.