Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

BF3 PIII modeling: Implantation, amorphisation and diffusion

Simulation von BF3-Plasmaionenimplantation: Implantation, Amorphisierung und Diffusion
 
: Essa, Z.; Cristiano, F.; Spiegel, Y.; Boulenc, P.; Qiu, Y.; Quillec, M.; Taleb, N.; Burenkov, A.; Hackenberg, M.; Bedel-Pereira, E.; Mortet, V.; Torregrosa, F.; Tavernier, C.

:

Pelaz, L. ; American Institute of Physics -AIP-, New York:
Ion Implantation Technology 2012. 19th International Conference on Ion Implantation Technology. Proceedings : 25-29 June 2012, Valladolid, Spain
Woodbury, N.Y.: AIP, 2012 (AIP Conference Proceedings 1496)
ISBN: 978-0-7354-1108-1 (Set)
ISBN: 978-0-7354-1109-8 (Book)
ISSN: 0094-243X
S.237-240
International Conference on Ion Implantation Technology (IIT) <19, 2012, Valladolid>
Englisch
Konferenzbeitrag
Fraunhofer IISB ()
Plasma; Ionenimplantation; Amorphisierung; Diffusion; Defekte

Abstract
In the race for highly doped ultra-shallow junctions (USJs) in complementary metal oxide semi-conductor (CMOS) technologies, plasma immersion ion implantation (PIII) is a promising alternative to traditional beamline implantation. Currently, no commercial technology computer aided design (TCAD) process simulator allows modeling the complete USJ fabrication process by PIII, including as-implanted dopant profiles, damage formation, dopant diffusion and activation. In this work, a full simulation of a p-type BF3 PIII USJ has been carried out. In order to investigate the various physical phenomena mentioned above, process conditions included a high energy/high dose case (10 kV, 5x1015 cm-2), specifically designed to increase damage formation, as well as more technology relevant implant condi tions (0.5 kV) for comparison. All implanted samples were annealed at different temperatures and times. As implanted profiles for both boron and fluorine in BF3 implants were modeled and compared to Secondary Ion Mass Spectrometry (SIMS) measurements. Amorphous/crystalline (a/c) interface depths were measured by transmission electron microscopy (TEM) and successfully simulated. Diffused profiles simulations agreed with SIMS data at low thermal budgets. A boron peak behind the a/c interface was observed in all annealed SIMS profiles for the 10 kV case, indicating boron trapping from EOR defects in this region even after high thermal budgets. TEM measurements on the annealed samples showed an end of range (EOR) defects survival behind the a/c interface, including large dislocation loops (DL s) lying on (001) plane parallel to the surface. In the last part of this work, activation simulations were compared to Hall measurements and confirmed the need to develop a (001) large BICs model.

: http://publica.fraunhofer.de/dokumente/N-222780.html