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Grain Size Distribution of Multicrystalline Silicon for Structure Characterisation of Silicon Wafers

: Schumann, M.; Haas, T.; Orellana Perez, T.; Riepe, S.

Volltext urn:nbn:de:0011-n-2210399 (459 KByte PDF)
MD5 Fingerprint: 5093cf3082f0d44396296ae15120f9f7
Erstellt am: 7.12.2012

European Commission:
26th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC. Proceedings : 5th to 9th September 2011 at the CCH - Congress Centre and International Fair Hamburg in Germany
München: WIP-Renewable Energies, 2011
ISBN: 3-936338-27-2
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <26, 2011, Hamburg>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()
Materialien - Solarzellen und Technologie; Silicium-Photovoltaik; Feedstock; Kristallisation und Wafering

Multicrystalline silicon has a share of approximately 50% in photovoltaic energy conversion. The multicrystalline structure of silicon has an influence on the efficiency of solar cells produced with this material. The aim of the present work is to summarize and evaluate different methods to characterize grain size distribution of multicrystalline silicon. The most common methods, the intercept and planimetric methods used in metallography are investigated. As a result of this investigation the circular intercept method is suggested as preferred method. For application of the preferred method a multicrystalline silicon block was crystallized and characterized at the SIMTEC laboratory of Fraunhofer ISE. Intercept length as a measure for grain size distribution was measured at several positions within this multicrystalline silicon block.