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Estimating hemispherical scatter from incident plane measurements of isotropic samples

: Stover, John; Schröder, Sven; Finck, Alexander von; Duparré, Angela


Hanssen, Leonard M. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Reflection, Scattering, and Diffraction from Surfaces III : 13 - 16 August 2012, San Diego, California, USA
Bellingham, WA: SPIE, 2012 (Proceedings of SPIE 8495)
ISBN: 978-0-8194-9212-8
Paper 84950F
Conference "Reflection, Scattering, and Diffraction from Surfaces" <3, 2012, San Diego/Calif.>
Fraunhofer IOF ()
BRDF; stray light analysis; hemispherical scatter

In the mid-1970's it became apparent that incident plane scatter data could be represented by simple two or three parameter expressions. This realization made possible the generation of stray light estimation codes which are used on everything from military weapons, to telescopes, to car headlights to flat panel display systems. Almost all of these applications estimate hemispherical scatter from incident plane measurements. For most of these applications estimates that are good to within a factor of three - or even an order of magnitude - are acceptable and can result in dramatic product improvements. This paper takes a closer look at how the out-of-incident-plane estimates are made and evaluates how accurate the process is for the case of optically rough isotropic surfaces. The estimating process is reviewed and estimates are compared to hemispherical scatter measurements. It will be shown how the empirical observations that led to the procedures now widely used can be understood using well-known scatter models that link the surface roughness and scattering properties.