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Validation of potentials and limitations of a high-frequency eddy current system in frequency sweep mode

 
: Hillmann, S.; Heuer, H.; Calzada, J.G.; Cooney, A.T.; Foos, B.C.; Meyendorf, N.

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Thompson, D.O. ; American Institute of Physics -AIP-, New York:
Review of progress in quantitative nondestructive evaluation. Vol.31. Pt.A : 38th Annual Review of Progress in Quantitative Nondestructive Evaluation, University of Vermont, Burlington, VT, U.S.A, July 17-22, 2011
Woodbury, NY: AIP Press, 2012 (AIP Conference Proceedings 1430)
ISBN: 978-0-7354-1014-5
ISBN: 978-0-7354-1013-8
ISBN: 0-7354-1013-5
S.433-440
Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE) <38, 2011, Burlington/Vt.>
Englisch
Konferenzbeitrag
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
To characterize very thin conductive layers on a conducting substrate using Eddy Current Techniques, low penetrations depths at high measurement frequencies are required. Equally high measurement frequencies are needed to characterize materials with very low electrical conductivity. For the characterization of the thickness of multi-layer-systems or layer-substrate-systems with very low variations of electrical conductivity, the multi-frequency approach may be a promising solution. To investigate the limitations of such high-frequency Eddy Current systems, experiments are performed using an extensive sample concept. Frequency dependent conductivity profiles that are obtained by conductivity calibration show remarkable results for different sample sets.

: http://publica.fraunhofer.de/dokumente/N-217093.html