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3D simulation of the dislocation dynamics in polycrystalline metal thin films

 
: Blanckenhagen, B. von; Arzt, E.; Gumbsch, P.

Zbib, H.M. ; Materials Research Society -MRS-:
Multiscale phenomena in materials - experiments and modeling related to mechanical behavior : Symposium held April 22 - 24, 2003, San Francisco, California, U.S.A.; Symposium W, held at the 2003 MRS spring meeting
Warrendale, Pa.: Materials Research Society, 2003 (Materials Research Society Symposium Proceedings 779)
ISBN: 1-558-99716-4
S.75-86
Symposium W: "Multiscale Phenomena in Materials - Experiments and Modeling Related to Mechanical Behavior" <2003, San Francisco/Calif.>
Materials Research Society (Spring Meeting) <2003, San Francisco/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer IWM ()
mechanical and acoustical property; linear defect; dislocation; thin film; plastic deformation; simulation

Abstract
The plastic deformation of polycrystalline fcc metal thin films with thick-ness of 1 µm and less is investigated by simulating the dynamics of discrete dislocations in a representative columnar grain. The simulations are based on the assumption that dislocation sources or multiplication sites are rare and that sources have to operate several times to generate appreciable plastic deformation. This model is thoroughly tested by calculating the response of randomly distributed dislocation sources to an applied stress and comparing the results with experimental data. Stress-strain curves, the influence of boundary conditions, dislocation densities, work hardening rates and their dependence on the film thickness as well as the dependence on grain orientation are studied. The agreement between simulation and experiment is good and many aspects of thin film plasticity can be understood with the assumption that small-scale plastic deformation is source controlled rather than mobility controlled.

: http://publica.fraunhofer.de/dokumente/N-21457.html