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Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n

 
: Höffgen, Stefan Klaus

:

IEEE Transactions on Nuclear Science 59 (2012), Nr.4, S.1161-1166
ISSN: 0018-9499
Englisch
Zeitschriftenaufsatz
Fraunhofer INT ()
DDR2 SDRAM; energy effects; ESA SEU-Monitor; heavy ions; indirect ionization; nuclear reaction; Power MOSFET; single event effects

Abstract
The ESA SEU-Monitor, a 2 Gbit DDR2 SDRAM and a 100 V n-channel power MOSFET have been irradiated at GSI with ions of energies from 80 to 1500 MeV/n. The measured SEE sensitivities are compared to low energy ( < 50 MeV /n ) data. The ESA SEU-Monitor and the DDR2 SDRAM showed only differences in the cross sections below the ionization threshold. Here the cross sections were lower for the high energy ions compared to the low energy ions. The power MOSFETs on the other hand showed a reduced safe operating area (SOA) for the high energy ions, although some experimental reasons other than the ion energy cannot be ruled out here.

: http://publica.fraunhofer.de/dokumente/N-214257.html