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Dislocation sources and the flow stress of polycrystalline thin metal films

 
: Blanckenhagen, B. von; Gumbsch, P.; Arzt, E.

:

Philosophical magazine. Letters 83 (2003), Nr.1, S.1-8
ISSN: 0950-0839
Englisch
Zeitschriftenaufsatz
Fraunhofer IWM ()
dislocation source; flow stress; thin metal

Abstract
Plastic deformation of thin metal films has been investigated with the heop of a dicrete dislocation dynamics simulation. In particular, the operation of a Frank-Read source was studied in the confined geometry of a thin polycrystalline film. The results lead to a new model for the dependence of flow stress on film thickness and grain size. It is based on the assumption that the number of dislocation sources per grain is small and multiple activation is required. The model predicts a flow stress that scales with the inverse film thickness or grain size ( whichever is smaller) and that is roughly four times higher than predicted by previous models, thereby giving better agreement with experimental data.

: http://publica.fraunhofer.de/dokumente/N-21408.html