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Characteristics of buried capacitors in LTCC multilayer packages

 
: Bartsch, H.; Walther, F.; Krümmer, R.; Reimann, T.; Barth, S.; Müller, J.

Gessner, T. ; European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components; Fraunhofer Research Institution for Electronic Nano Systems ENAS:
Smart systems integration 2011. 5th European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components. CD-ROM : Dresden, Germany, 22 - 23 March 2011
Berlin: VDE-Verlag, 2011
ISBN: 978-3-8007-3324-8
4 S.
European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components <5, 2011, Dresden>
Englisch
Konferenzbeitrag
Fraunhofer IKTS ()

: http://publica.fraunhofer.de/dokumente/N-212552.html