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Analytical solution for charge carrier transients in a two-layer-structure

: Henninger, V.; Warta, W.

Volltext urn:nbn:de:0011-n-2096112 (830 KByte PDF)
MD5 Fingerprint: 116521531f50953cac83b50d9be5a4e4
Erstellt am: 9.11.2012

Ossenbrink, H.A.:
Fourteenth European Photovoltaic Solar Energy Conference 1997. Proceedings. Vol.2 : International conference held at Barcelona, Spain, 30 June-4 July 1997
Bedford: Stephens, 1997
ISBN: 1-901675-03-5
ISBN: 1-901675-01-9
ISBN: 1-901675-02-7
European Photovoltaic Solar Energy Conference <14, 1997, Barcelona>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()

The use of photo-conductance decay measurements for determining charge carrier lifetimes in a two-layer structure was up to now limited by the lack of an appropriate analytical solution describing the carrier dynamics. We present an exact solution for arbitrary layer parameters. We prove that in the limit that the lifetime in layer 1 is much higher than in layer 2 the exact solution reduces to the standard approximation with an effective recombination velocity for layer 2. Plots for the deviation of the approximate from the exact solution for wide parameter ranges are presented. Furthermore, we describe a sensitive test for contamination in deposition equipment.