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Packaging development for GaAs X-ray line detectors

 
: Oppermann, M.; Albrecht, O.; Lohse, T.; Metasch, R.; Zerna, T.; Wolter, K.-J.

:

Institute of Electrical and Electronics Engineers -IEEE-:
EPTC 2011, 13th Electronics Packaging Technology Conference : 7th-9th December 2011, Singapore
New York, NY: IEEE, 2011
ISBN: 978-1-4577-1983-7
ISBN: 1-4577-1983-5
ISBN: 978-1-4577-1981-3
S.203-206
Electronics Packaging Technology Conference (EPTC) <13, 2011, Singapore>
Englisch
Konferenzbeitrag
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
Direct converting X-ray line detectors might be a low-cost solution for inline X-ray inspection systems for electronics production and other industries. Possible detector materials are semiconductors in general, in our case GaAs.

: http://publica.fraunhofer.de/dokumente/N-208898.html