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Influence of beam conditions and energy for SEE testing

 
: Ferlet-Cavrois, V.; Schwank, J.R.; Liu, S.; Muschitiello, M.; Beutier, Th.; Javanainen, A.; Hedlund, A.; Poivey, C.; Zadeh, A.; Harboe-Sorensen, R.; Santin, G.; Nickson, B.; Menicucci, A.; Binois, C.; Peyre, D.; Hoeffgen, S.K.; Metzger, S.; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.

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Institute of Electrical and Electronics Engineers -IEEE-; European Space Agency -ESA-, Paris; Instituto Nacional de Tecnica Aeroespacial -INTA-:
12th European Conference on Radiation and its Effects on Components and Systems, RADECS 2011. Proceedings : Sevilla, Spain, 19 - 23 September 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-0585-4
ISBN: 1-4577-0585-0
ISBN: 978-1-4577-0587-8
S.690-699
European Conference on Radiation and its Effects on Components and Systems (RADECS) <12, 2011, Sevilla>
Englisch
Konferenzbeitrag
Fraunhofer INT ()

Abstract
The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.

: http://publica.fraunhofer.de/dokumente/N-208890.html